| Items | LPDDR3 | LPDDR4x |
| CLK scheme | Differential (CLK/CLKB) | ← |
Data scheme | DDR Single-ended, Bi-Directional | ← |
DQS scheme | Differential (DQS/DQSB), Bi-Directional | ← |
ADD / CMD scheme | DDR | SDR |
State Diagram | | Refer to the Datasheet |
Command Truth Table | No support BST | Refer to the Datasheet |
Data mask Truth Table | As is | ← |
I/O Interface | HSUL_12 | LVSTL_06 |
Burst Length | 8 | 16, 32(OTF) |
Burst Type | Sequential | ← |
No Wrap | No support | ← |
# of Bank per channel | 8 | ← |
Organization per channel | x16/x32 | x16 |
Data Mask | Support (Write) | Support (Masked Write) |
Refresh mode | Auto / Self Refresh | ← |
Masked Write | N/A | Support |
DBI | N/A | Support |
| Row | Refer to the Datasheet (CA0 ~ CA9 1clock DDR based) | Refer to the datasheet (2Gb per channel)
(CA0 ~ CA5 4clock SDR based) |
Column |
Bank |
Refresh Requirements |
| Speed bin [Mbps] | 1600/1866 | 3200/3733/4266 |
Read/Write latency | Refer to the Datasheet | Refer to the datasheet |
Core Parameters |
IO Parameters |
CA / CS / Setup / Hold / Deratin |
Data Setup / Hold / Deratin |
| PASR | Support | ← |
TCSR | Support | ← |
Deep Power Down | No Support | N/A |
Configurable D/S | Support | ← |
ZQ Calibration | Support | ← |
DQ Calibration | Support1) | Refer to the datasheet |
CA Calibration | Support | ← |
Write Leveling | Support | ← |
| VDD1 [V] | 1.70 ~ 1.95 | ← |
VDD2 [V] | 1.14 ~ 1.30 | 1.06 ~ 1.17 |
VDDQ [V] | 1.14 ~ 1.30 | 0.57 ~ 0.65 |
VDDCA [V] | 1.14 ~ 1.30 | N/A |
IDD Specification Parameters and Test Conditions | IDD Measurement Conditions | As is | BL16 based |
IDD Specification | As is | Refer to the datasheet |
Pull-down Pull-up Characteristics | w/ ZQ Calibration | As is | ← |
w/o ZQ Calibration | As is | ← |
w/ VOH Calibration | N/A | Support |
w/o VOH Calibration | N/A | Support |
Temperature and Voltage Sensi- tivity | As is | ← |
RZQI-V Curve | As is | ← |
Input/Output Capacitance1) | Refer to the Datasheet | Refer to the Datasheet |
Absolute maximum DC ratings | VDD1 [V] | -0.4 ~ 2.3 | -0.4 ~ 2.1 |
VDD2 [V] | -0.4 ~ 1.6 | -0.4 ~ 1.5 |
VDDQ [V] | -0.4 ~ 1.6 | -0.4 ~ 1.0 |
VDDCA [V] | -0.4 ~ 1.6 | N/A |
VIN/VOUT [V] | -0.4 ~ 1.6 | -0.4 ~ 1.5 |
Tstg [’C] | -55 ~ 125 | ← |
Input leakage [uA] | As is | -2 ~ 2 |
Input/Out- put Operat- ing condition | AC/DC Logic Input Levels for Single- ended Signals | CA and CS pins | AC : VREF ± 0.150V / ± 0.135V
(1600/1866)
DC : VREF ± 0.10V/0.10V (1600/1866) | VREF(CA), Internal VREF |
CKE pin | 0.65×VDDCA ~ 0.35×VDDCA | AC : 0.75×VDD2 @ Min VDD2+0.2 @ Max
DC : 0.65×VDD2 @ Min VDD2+0.2 @ Max |
DQ pins | AC : VREF ± 0.15V/0.135V (1600/1866)
DC : VREF ± 0.10V/0.10V (1600/1866) | VREF(DQ), Internal VREF |
VREF_CA/DQ tolerance | 0.49×VDDQ ~ 0.51×VDDQ | Internal VREF |
AC/DC Logic Input Levels for Differen- tial | VIHdiff/VILdiff (AC/DC) tDVAC | As is | TBD |
VSEH/VSEL(AC) | As is | TBD |
Differential Input Cross Point Voltage | VIXCA/VIXDQ | As is | TBD |
Slew Rate defini- tions for Differential | VILdiff /VIHdiff (Max/Min) | As is | TBD |
AC/DC Output lev- els for Differential | VOHdiff / VOLdiff (AC) | As is | TBD |
IOZ | As is | -5 ~ 5 |
MMPUPD | As is | TBD |
Single ended out- put Slew | VOH/VOL(AC/DC) | As is | TBD |
SRQse | As is | 3.5 ~ 9.0 |
Differential Output Slew | VOHdiff/VOLdiff(AC) | As is | TBD |
SRQdiff | As is | 6.0 ~ 18.0 |
Overshoot / Under- shoot | Maximum Amplitude | As is | ← |
Maximum Area | VDD/VSS : 0.1[V-ns] | ← |
Driver Output Timing | HSUL_12 | LVSTL_06 |
注:Name | Type | Description |
CK_t_A, CK_c_A CK_t_B, CK_c_B | Input | Clock: CK_t and CK_c are differential clock inputs. All address, command, and control input signals are sampled on the crossing of the positive edge of CK_t and the negative edge of CK_c. AC timings for CA parameters are referenced to CK. |
CKE_A, CKE_B | Input | Clock Enable: CKE HIGH activates and CKE LOW deactivates the internal clock circuits, input buffers, and output drivers. Power-saving modes are entered and exited via CKE transitions. CKE is part of the command code. |
CS_A CS_B | Input | Chip Select: CS is part of the command code. |
CA[5:0]_A
CA[5:0]_B | Input | Command/Address Inputs: CA signals provide the Command and Address inputs according to the Command Truth Table. |
ODT_CA_A
ODT_CA_B | Input | CA ODT Control: The ODT_CA pin is used in conjunction with the Mode Register to turn on/off the On-Die-Termination for CA pins. |
DQ[15:0]_A DQ[15:0]_B | I/O | Data Inputs/Outputs: Bi-direction data bus |
DQS[1:0]_t_A DQS[1:0]_c_A DQS[1:0]_t_B
DQS[1:0]_c_B | I/O | Data Strobe: DQS_t and DQS_c are bi-directional differential output clock signals used to strobe data during a READ or WRITE. The Data Strobe is generated by the DRAM for a READ and is edge-aligned with Data. The Data Strobe is generated by the Memory Controller for a WRITE and must arrive prior to Data. Each byte of data has a Data Strobe signal pair. |
DMI[1:0]_A DMI[1:0]_B | I/O | Data Mask Inversion: DMI is a bi-directional signal which is driven HIGH when the data on the data bus is inverted, or driven LOW when the data is in its normal state. Data Inversion can be disabled via a mode register setting. Each byte of data has a DMI signal. This signal is also used along with the DQ signals to provide write data masking information to the DRAM. The DMI pin function - Data Inversion or Data mask - depends on Mode Register setting. |
ZQ | Reference | Calibration Reference: Used to calibrate the output drive strength and the termination resistance. There is one ZQ pin per die. The ZQ pin shall be connected to VDDQ through a 240Ω ± 1% resistor. |
VDDQ,VDD1, VDD2 | Supply | Power Supplies: Isolated on the die for improved noise immunity. |
VSS, VSSQ | GND | Ground Reference: Power supply ground reference. |
RESET_n | Input | RESET: When Asserted LOW, the RESET_n signal resets all channels of the die. There is one RESET_n pad per die. |